PRODUCTS THAT DRAMATICALLY REDUCE THE COST OF IC TEST
MCT is focused on helping companies reduce the soaring cost of IC testing. Reducing the cost of test is “mission critical” to IDM’s and OSAT subcontractors in their efforts to improve margins and remain competitive in their test operations. MCT has the industry’s most complete selection of automated tools for this fast-growing market segment. MCT produces the SH series of strip test handlers, the FH film frame strip test handler and the MH series of laser mark handlers. View our short video to learn more!
STATE OF THE ART SOLUTIONS FOR STRIP TEST
Our FH-1200 Film Frame Handler is designed to dramatically reduce the cost of test for QFN, WLCSP and eWLB packages by enabling high parallelism testing. It can accommodate 200mm and 300mm wafer rings onto which multiple strips can be mounted.
Our SH-5000 and SH-5300 Tri-Temp Strip Test Handlers enable IC testing from –55 Deg C to +160 Deg C. Our Tri-Temp Strip Test Handlers are universal machines that can handle virtually any type of semiconductor device package in lead frame, strip or panel format.